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  • Articles  (9)
  • Articles: DFG German National Licenses  (9)
  • ToF-SIMS  (9)
  • Wiley-Blackwell  (9)
  • 1995-1999  (9)
  • 1985-1989
  • 1997  (9)
  • Physics  (9)
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  • Articles  (9)
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  • Articles: DFG German National Licenses  (9)
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  • Wiley-Blackwell  (9)
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  • 1995-1999  (9)
  • 1985-1989
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  • Physics  (9)
  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 41-45 
    ISSN: 0142-2421
    Keywords: ToF-SIMS ; polymer toxicity ; poly(methylmethacrylate) ; polystyrene ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Poly(methylmethacrylate) (PMMA) and polystyrene (PS) thin films of different tacticities have been analysed by time-of-flight (ToF) SIMS in order to look for a possible influence of the stereoregularity on their fingerprint spectra (m/z≤200). Because, at first glance, the spectra of samples with different tacticities seemed rather similar, the intensity ratios between secondary ions from main polymer chain and those from pendant group were evaluated. By this procedure, it was found that isotactic PMMA can be clearly distinguished from syndiotactic and atactic PMMA. A lower concentration of the methyl-methacrylate pendant group was detected at the surface of the isotactic sample. In the case of PS, more phenyl groups were found to be present at the surface of isotactic PS and an empirical criterion is proposed to differentiate between atactic and isotactic PS. © 1997 by John Wiley & Sons, Ltd.
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 790-798 
    ISSN: 0142-2421
    Keywords: SIMS ; ToF-SIMS ; polymer ; molecular weight effects on intensities ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Time-of-flight (ToF) SIMS spectra were acquired from a variety of elastomer and thermoplastic molecular weight (MW) standards: polyisoprene (PIP), 1,4-polybutadiene (PBD), polyisobutylene (PIB), polyethylene (PE), polystyrene (PS), polypropylene (PP) and poly(1-butene) (P1-B). These spectra were then examined to determine any correlation between relative ion intensities and MW. In all cases, the relative intensities of protonated monomer (monomer+H) ions were particularly sensitive to MW. These monomer+H relative ion intensities were fairly constant at MWs above 20000, but increased dramatically and contiguously as the MW of the polymer decreased below 20000. For all of the polymers examined, the variation of monomer+H ion intensities with MW could be fit using the general relationship: Relative monomer+H ion intensity=M(MW/1000)E+B, where M is the slope, B is the ion ratio intercept and E is an exponent with values between -0.5 and -0.6. Using this general relationship, ToF-SIMS MW calibration lines were developed for PIP, PBD, PIB, PE, PS, PP and PI-B. These calibration lines could be used to determine the presence and approximate MW of low-MW (≤20000) polymer, but could not distinguish the MWs of high-MW (≥20000) polymers. The technique was applied to the analysis of MWs on PP fibers. Moreover, the MW calibrations were shown to be useful for determining the presence of unknown low-MW waxes and additives on polymeric surfaces. © 1997 by John Wiley & Sons, Ltd.
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  • 3
    ISSN: 0142-2421
    Keywords: carbon nitride ; PVD ; hybridization ; AES ; XPS ; XANES ; ToF-SIMS ; magnetron-sputtered film ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The existence of β-C3N4 with hardness characteristics similar or better than diamond was predicted in 1990 by Liu and Cohen. Many studies have since been devoted to the synthesis of this compound. In the present work, carbon nitride films were deposited by various reactive magnetron sputtering processes of graphite targets in pure nitrogen and characterized by AES, XPS, x-ray adsorption near-edge structure (XANES) and static time-of-flight SIMS (ToF-SIMS). Various bonding states (single and double bond) are observed between carbon and nitrogen atoms and between carbon atoms but there is no evidence in the XANES results for either the presence of carbon-nitrogen triple bonds or a pyridine-like ring structure. Surface N/C ratios were estimated to be close to 0.3. Carbon K-edge XANES lineshapes, the C 1s plasmon-loss structure and the calculated density (2.2 g cm-3) indicate that the films are similar to diamond-like carbon without long-range ordering. The presence of CxNy fragments with 1≤y〈4 and the low abundance of CHx and CHxNy fragments in ToF-SIMS spectra further confirm that the carbon atoms do not adopt a graphite or pyridine-like cyclic two-dimensional structure and that the films are not significantly hydrogenated. A three-phase solid solution model is proposed for the composition of the films: a ‘free’ carbon phase, an sp3 - carbon-nitrided phase and an sp2 - carbon-nitrided phase. The relative proportion of these phases is influenced by the deposition conditions. Enhanced plasma ionization reactive magnetron sputtering leads to higher density and to a higher fraction of the sp3 carbon phase. © 1997 John Wiley & Sons, Ltd.
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 799-803 
    ISSN: 0142-2421
    Keywords: Nylon-6,6 ; static SIMS ; ToF-SIMS ; polymer surface analysis ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The characteristic static SIMS spectra of the cyclic monomer of Nylon-6,6 have been obtained from the isolated and purified material. The spectra are sufficiently different from those obtained from bulk Nylon-6,6 polymer. Intense fragment ions corresponding to (M+H)+ and (M-H)- are observed in the positive and negative ion spectra, respectively. Results from both quadrupole and ToF-SIMS measurements are presented. © 1997 by John Wiley & Sons, Ltd.
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  • 5
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 261-274 
    ISSN: 0142-2421
    Keywords: ToF-SIMS ; PMMA ; molecular weight effect ; relative ion intensities ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: This paper is concerned with the effects that polymer molecular weight, casting solvent, sonification (with a non-polymer solvent) and annealing have upon the secondary ion mass spectrometry (SIMS) of polymers.Films of a series of monodispersed poly(methyl methacrylate) (PMMA) standards, Mw 2965-1200000, were prepared by solution casting from four solvents (tetrahydrofuran (THF), 2-butanone, toulene and chloroform) onto clean aluminium (Al) substrates. The PMMA films were characterized by high- and unit-mass resolution time-of-flight secondary ion mass spectrometry (ToF-SIMS). To determine the significance of variations seen in ion intensities, one PMMA sample was re-analysed 24 times, and the scatter in the absolute counts and normalized and ratioed ion intensities for specific (termed ‘key’) positive and negative ions were calculated. This provided 95% confidence error bars, which were subsequently employed. The 95% confidence limits were significantly reduced by normalizing or ratioing.Molecular weight was found to have the greatest effect in the SIMS spectra obtained, with the differences being most marked between Mw=2965 and Mw=89100. This was seen in both the total negative ion counts (m/z 31-200) and the key negative ion ratios. An explanation based on the surface concentration of chain ends is presented. Negative ion ratios were shown to be very sensitive to trace amounts of residual solvents. By annealing above the PMMA glass transition temperature Tg solvent-free films were produced from three solvents and these were spectrally indistinguishable. Solvent-free films could not be produced from THF. Residual solvent was identified by high mass resolution ToF-SIMS. Sonification with hexane, a polymer non-solvent, had a considerable effect on the total negative ion counts (m/z 31-200). No concomitant chemical changes were detected, so this effect is thought to arise from a physical perturbation of the surface. © 1997 by John Wiley & Sons, Ltd.
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  • 6
    ISSN: 0142-2421
    Keywords: ToF-SIMS ; high mass resolution ; quantification ; methacrylate copolymers ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A previous XPS and low mass resolution (quadrupole) SIMS study of methyl methacrylate-poly(ethylene glycol) methacrylate random copolymers indicated (by XPS) a surface composition close to that of the bulk, however the trends in SIMS intensity ratios for peaks chosen to represent the individual monomers showed departures from linearity that were not understood. High mass resolution time-of-flight (ToF) SIMS data has shed light on the earlier results and, as a result, linear correlations have been established. In addition it has been possible to study high mass fragments derived from the poly(ethylene glycol) side chain. © 1997 by John Wiley & Sons, Ltd.
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  • 7
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 167-176 
    ISSN: 0142-2421
    Keywords: ToF-SIMS ; ion beam damage ; poly(vinyl chloride) ; poly(methyl methacrylate) ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Changes in the SIMS spectra of poly(vinyl chloride) (PVC) and poly(methyl methacrylate) (PMMA) as a function of 8 keV Cs+ dose have been studied in the range 1011-5×1013 ions cm-2. In order to resolve uncertainties in previous studies (based on quadrupole SIMS and insulating samples) this work has utilized a high mass resolution ToF-SIMS instrument and films on silicon sufficiently thin to obviate the need for surface potential control (charge neutralization). The form of the damage curves has been compared with a recently introduced model of damage development based on the statistics of bond breaking. © 1997 by John Wiley & Sons, Ltd.
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  • 8
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 878-888 
    ISSN: 0142-2421
    Keywords: molecular weight ; polymer ; polystyrene ; ToF-SIMS ; principal component analysis ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Monodisperses polystyrenes (PS) with molecular weight (Mn) ranging from 850 to 20000 g mol-1 and with different butyl end-groups have been analysed by time-of-flight secondary ion mass spectrometry (ToF-SIMS). Only the fingerprint part of the spectra (m/z〈200) has been considered. This part comes from the fragmentation of the macromolecules and this is the only contribution in the secondary ion spectra of bulk polymers. In a former study, it has been shown that Mn has a significant influence on the PS secondary molecular ion intensities. It was found that not only the end-group characteristic ion intensities are modified for Mn〈50000 g mol-1, but also those related to main chain fragments. In this study, the possibility to use this effect to quantify the molecular weight of the macrochains at the surface is investigated. Because the quantification method should preferably include all the information contained in the spectra (over 150 peaks), statistical methods are needed. Principal component analysis is applied to these ToF-SIMS data. Principal component analysis builds the best linear combination of the variables, namely the principal components that describe the greatest amount of variation of the sample set. It is found that only one principal component is required to account for the molecular weight variations and a second one allows the samples to be discriminated depending on their butyl end-groups. Whatever the PS end-groups (linear, secondary or tertiary butyl), the correlation found between the first principal component and the sample molecular weight leads to the definition of a universal curve that allows the molecular weight determination for an unknown monodisperse PS sample. © 1997 John Wiley & Sons, Ltd.
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  • 9
    ISSN: 0142-2421
    Keywords: carbon nitride ; PVD ; hybridization ; AES ; XPS ; XANES ; ToF-SIMS ; magnetron-sputtered film ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The existence of β-C3N4 with hardness characteristics similar or better than diamond was predicted in 1990 by Liu and Cohen. Many studies have since been devoted to the synthesis of this compound. In the present work, carbon nitride films were deposited by various reactive magnetron sputtering processes of graphite targets in pure nitrogen and characterized by AES, XPS, x-ray absorption near-edge structure (XANES) and static time-of-flight SIMS (ToF-SIMS). Various bonding states (single and double bond) are observed between carbon and nitrogen atoms and between carbon atoms but there is no evidence in the XANES results for either the presence of carbon-nitrogen triple bonds or a pyridine-like ring structure. Surface N/C ratios were estimated to be close to 0.3. Carbon K-edge XANES lineshapes, the C 1s plasmon-loss structure and the calculated density (2.2 g cm-3) indicate that the films are similar to diamond-like carbon without long-range ordering. The presence of CxNy fragments with 1≤y〈4 and the low abundance of CHx and CHxNy fragments in ToF-SIMS spectra further confirm that the carbon atoms do not adopt a graphite or pyridine-like cyclic two-dimensional structure and that the films are not significantly hydrogenated. A three-phase solid solution model is proposed for the composition of the films: a ‘free’ carbon phase, an sp3 - carbon-nitrided phase and an sp2 - carbon-nitrided phase. The relative proportion of these phases is influenced by the deposition conditions. Enhanced plasma ionization reactive magnetron sputtering leads to higher density and to a higher fraction of the sp3 carbon phase. © 1997 by John Wiley & Sons, Ltd.
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