Abstract
THE electron diffraction patterns of thin films of alloys sometimes show fine detail that is not fully understood1. Empirical methods of solution are not easy to apply in view of the large number of possible models. We are therefore investigating the possibility of using optical diffraction methods2; the diffraction pattern of a mask of punched holes representing an atomic arrangement can be directly compared with the observed electron diffraction pattern.
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References
See, for example, Glossop, A. B., and Pashley, D. W., proc. Roy. Soc., A, 250, 132 (1959).
Taylor, C. A., and Lipson, H., Optical Transforms (Bell, London, 1964).
Watanabe, D., Trans. Jap. Inst. Met., 3, 234 (1962).
Schubert, K., Kiefer, B., Wilkens, M., and Haufler, R., Z. Metallkde., 46, 692 (1955).
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BICKNELL, J., LIPSON, H. Methods for interpreting Electron Diffraction Patterns of Thin Alloy Films. Nature 213, 169–170 (1967). https://doi.org/10.1038/213169a0
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DOI: https://doi.org/10.1038/213169a0
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