Microscopic and macroscopic field emission properties of amorphic diamond films on n- and p-type silicon substrates were studied by combined scanning tunneling microscopy/spectroscopy and integral field emission I–V measurements. Microscopic scanning tunneling spectroscopy showed that amorphic diamond films on n-Si have lower threshold voltage and higher emission current than amorphic diamond films on p-Si. The observed rectification characteristics suggest that amorphic diamond on n-Si is an ideal forward-biased p-n junction cold cathode emitter; however, there is no significant difference between these two structures by integral field emission I–V measurements. Conversion of the smooth amorphic diamond film into porous sp3/sp2 composites with sharp features under electric fields higher than 50 V/μm, followed by preferred electron emission from the porous composite sites of high transconductance, was believed to be the cause.
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1 February 1997
Research Article|
February 01 1997
Field emission properties of diode devices based on amorphic diamond-Si heterojunctions
W. N. Wang;
W. N. Wang
H. H. Wills Physics Laboratory, Bristol University, Royal Fort, Tyndall Avenue, Bristol BS8 1TL, United Kingdom
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N. A. Fox;
N. A. Fox
H. H. Wills Physics Laboratory, Bristol University, Royal Fort, Tyndall Avenue, Bristol BS8 1TL, United Kingdom
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D. Richardson;
D. Richardson
H. H. Wills Physics Laboratory, Bristol University, Royal Fort, Tyndall Avenue, Bristol BS8 1TL, United Kingdom
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G. M. Lynch;
G. M. Lynch
H. H. Wills Physics Laboratory, Bristol University, Royal Fort, Tyndall Avenue, Bristol BS8 1TL, United Kingdom
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J. W. Steeds
J. W. Steeds
H. H. Wills Physics Laboratory, Bristol University, Royal Fort, Tyndall Avenue, Bristol BS8 1TL, United Kingdom
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J. Appl. Phys. 81, 1505–1508 (1997)
Article history
Received:
August 12 1996
Accepted:
October 30 1996
Citation
W. N. Wang, N. A. Fox, D. Richardson, G. M. Lynch, J. W. Steeds; Field emission properties of diode devices based on amorphic diamond-Si heterojunctions. J. Appl. Phys. 1 February 1997; 81 (3): 1505–1508. https://doi.org/10.1063/1.363915
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