Elsevier

Physics Letters A

Volume 61, Issue 3, 2 May 1977, Pages 201-202
Physics Letters A

Characteristic X-ray intensities: Dependence on orientation in BI-atomic single crystals

https://doi.org/10.1016/0375-9601(77)90294-8Get rights and content

Abstract

The ratio of characteristic X-ray intensities excited by electron Bloch waves in bi-atomic crystals has been investigated as function of the crystal orientation. The result indicates the possibility to use the electron probe for locating the site of impurity atoms in single crystals.

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    Phil. Mag.

    (1962)
There are more references available in the full text version of this article.

Cited by (2)

1

Reported in part on the 17. Tagung für Elektronenmikroskopie, Berlin 1975.

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