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Magnetic-structure analysis in scanning electron beam devices by means of the LEED Spin-polarization detector

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Abstract

Magnetic-structure analysis by means of spin-polarization analysis of the secondary electrons in a scanning electron microscope-type (SEM) experiment is demonstrated, using the LEED spin-polarization detector. The advantages in size, handling ability and efficiency, relevant for SEM operation, are pointed out. Limitations and future development are discussed.

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Authors and Affiliations

  1. Institut für GrenzflÄchenforschung und Vakuumphysik, Kernforschungsanlage Jülich, Postfach 1913, D-5170, Jülich, Fed. Rep. Germany

    J. Kirschner

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  1. J. Kirschner
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Kirschner, J. Magnetic-structure analysis in scanning electron beam devices by means of the LEED Spin-polarization detector. Appl. Phys. A 36, 121–123 (1985). https://doi.org/10.1007/BF00624930

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  • DOI: https://doi.org/10.1007/BF00624930

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