High precision wavelength meter with Fabry-Perot optics

Abstract

A high precision wavelength meter in the visible is described, which is based on a Fabry-Perot interferometer with several etalons of different resolution. The interference fringe pattern projected on a photo-diode array detector is computationally processed to give a stepwise refinement of the wavelength value to any adjusted accuracy. The present model intends to provide digital and real-time values of high precision wavelength for dye-laser spectroscopy, and to serve as a monitor or as a pilot for wavelength control of a dye-laser source of nanosecond pulses. The model is, therefore, designed with particular emphasis on its short-pulse capability and on-line mode of operation as well as on its high sensitivity and resolution. Some arrangements of essential necessity are involved therein, such as to avoid an errorneous wavelength readout for a noisy incidence of pulsed field. The ultimate accuracy of wavelength measurement is prescribed by the resolving power of the thickest etalon employed. As applied to the pulsed source, the model determines the wavelength to the accuracy of ±one part in 10⁷ for even a single shot nanosecond incidence of a fraction of μJ energy. The design and performance are described in connection to pulsed dye-laser incidence.