Abstract
Ceramic films and film systems (ZrO2 films, ZrO2/Ti multilayers, and BN films) are deposited by pulsed laser deposition (PLD) and analyzed using X-ray photoelectron (XPS), Auger electron (AES), and micro-Raman spectroscopies. The electron spectroscopies are used to determine the film stoichiometry, the nature of the bonding, and to specify contaminant species. The micro-Raman spectroscopy gives information on crystal structure, grain size, and mechanical stress within the films. In ZrO2 films a stoichiometry is achieved with typically 5%, with only weak dependencies on processing variables. The only contaminants are a small amount of water from the ambient gas and a carbonaceous surface layer. Multilayers consisting of alternating ZrO2 and Ti layers exhibit a TiC contamination within the Ti layers. Depending on the processing variables, BN films may be nearly stoichiometric or may have significant, even dominant contaminations throughout the film from elemental B, B2O3, and/or a boron-oxynitride species. The first component is due to the non-stoichiometric material removal from the target (N-depletion) at low laser fluences, as confirmed by XPS measurements on irradiated targets. The second and third arise from H2O in the ambient, and exhibit a complex dependence on processing variables. Micro-Raman spectra show only amorphous or hexagonalphase BN. Depending on the position on the substrate relative to the laser-induced vapour/plasma plume, there may be a particle deposition or mechanical stress within the films, as evidenced from large shifts (up to 15 cm−1) of the Raman spectral peaks.
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References
Saenger KL (1993) Process Adv Mater 2:1–24
See, e.g., Lowndes DH, Norton DP, Zhu S, Zheng X-Y (1992) In: Fogarassy E, Lazare S (eds) Laser ablation of electronic materials: basic Mechanisms and Applications. European Materials Research Society Monographs, Vol 4. North Holland Elsevier, Amsterdam
Alunovic M, Kreutz EW, Voss A, Aden M, Sung H (1994) Iron Steel Inst Japan Intern 34:507–515
Salmang H, Scholze H (1983) Keramische Werkstoffe, part 2, 6th edn. Springer, Berlin Heidelberg New York
Wiemhöfer H-D, Harke S, Vohrer U (1990) Solid State Ionics 40/41:433–439
Sung H, Erkens G, Funken J, Voss A, Lemmer O, Kreutz EW (1992) Surf Coat Technol 54/55:541–547
Holleck H (1987) In: Fischmeister H, Jehn H (eds) Hartstoffschichten zur Verschleißminderung. Informationsgesellschaft, Oberursel, Germany
Wada T, Yamashita N (1992) J Vac Sci Technol A 10:515–520;
Burat O, Bouchier D, Stambouli V, Gautherin G (1990) J Appl Phys 68:2780–2790
See, e.g., Doll GL, Perry TA, Sell JA (1991) In: Atwater HA, Houle FA, Lowndes DH (eds) Surface chemistry and beamsolid interactions: materials research society symposium proceedings, Vol 201. Materials Research Society, Pittsburgh, Pennsylvania
Horwitz JS, Sprague JA (1994) In: Chrisey DB, Hubler GK (eds) Pulsed laser deposition of thin films. Wiley, New York
Funken J, Kreutz EW, Krösche M, Sung H, Voss A, Erkens G, Lemmer O, Leyendecker T (1992) Surf Coat Technol 52:221–227
Swift P (1982) Surf Interf Anal 4:47–51;
Swift P, Shuttle-worth D, Seah MP (1983) In: Briggs D, Seah MP (eds) Practical surface analysis by Auger and X-ray photoelectron spectroscopy. Wiley, London
Barr TL (1978) J Phys Chem 82:1801–1810
Wagner CD, Riggs WM, Davis LE, Moulder JF, Muilenberg GE (1979) Handbook of X-ray photoelectron spectroscopy. Perkin-Elmer Corporation, Eden Prairie, Minnesota (and references therein)
Lide DR (1992/1993) Handbook of chemistry and physics. CRC Press, Boca Raton, Florida
See, e.g., Goodman DW, Kelley RD, Madey TE, Yates JT Jr (1980) J Catal 63:226–234
Wittmaak K (1992) In: Briggs D, Seah MP (eds) Practical surface analysis, Vol 2. Ion and neutral spectroscopy. Wiley, Chichester
See, e.g., Geohegan DB (1994) In: Chrisey DB, Hubler GK (eds) Pulsed laser deposition of thin films. Wiley, New York
Aleshin VG, Sokolov AN, Chudinov MG, Shul zhenko AA (1986) Sov Powder Metall Metal Ceram 12:1010–1014;
Hendrickson DN, Hollander JM, Jolly WL (1970) Inorg Chem 9:612–615
Pfleging W, Klotzbücher T, Wesner DA, Kreutz EW (1995) Diam Rel Mat 4:370–374
Nemanich RJ, Solin SA, Martin RM (1981) Phys Rev B 23:6348–6356
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Wesner, D.A., Pfleging, W., Klotzbücher, T. et al. Surface analysis of films and film systems produced by pulsed laser deposition. Fresenius J Anal Chem 353, 729–733 (1995). https://doi.org/10.1007/BF00321359
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DOI: https://doi.org/10.1007/BF00321359