Abstract
In the past the use of network analyzersfor measuring the electrical properties of materialsmakes the microwave techniques unsuitable for industrial purposes. Butrecently much attention has been paid to the development of microwave systems dedicated to the nondestructive testing of materials. In general these apparatus are designed for a given applicationso the cost in comparison with the network analyzer is considerably lower. The aim of this paper is to present results obtained from utilizing various configurations of original S-Parameters Measurement System (SPMS) constructed for practical use.
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Lasri, T., Glay, D., Achraït, L. et al. Microwave Methods and Systems for Nondestructive Control. Subsurface Sensing Technologies and Applications 1, 141–160 (2000). https://doi.org/10.1023/A:1010130911805
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DOI: https://doi.org/10.1023/A:1010130911805