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X-ray diffraction study of amorphous Al77.5Mn22.5 and Al56Si30Mn14 alloys

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Abstract

The structure of amorphous sputtered Al77.5Mn22.5 and as-spun Al56Si30Mn14 alloys is investigated by X-ray diffraction. Some distinct features are observed in the intensity profile, i.e. a pronounced prepeak atQ = 16 nm−1 in both the alloys and a shoulder at the low-Q side in Al-Si-Mn. Also in the radial distribution functions, the first peak has a shoulder at the high-r side. This experimental evidence suggests the presence of a strong chemical short-range order persisting in the α phase.

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Matsubara, E., Harada, K., Waseda, Y. et al. X-ray diffraction study of amorphous Al77.5Mn22.5 and Al56Si30Mn14 alloys. J Mater Sci 23, 753–756 (1988). https://doi.org/10.1007/BF01174716

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  • DOI: https://doi.org/10.1007/BF01174716

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