Abstract
By means of photo-emission electron microscopy, which is described briefly, X-ray diffraction and electron microprobe analysis the hypo- and hypereutectic solidification in the system Zn2SiO4-SiO2 has been investigated. Faceted (idiomorphic) growth of stableα− and metastableΒ-zinc silicate with some excess SiO2 on the hypoeutectic side of the phase diagram and a metastable region of liquid immiscibility on the SiO2-rich (hypereutectic) side determine the respective phase intergrowth morphologies. Unconstrained eutectic solidification causes a “divorced eutectic” where the zinc silicate constituent grows first from the undercooled liquid, which is simultaneously enriched in SiO2.
Similar content being viewed by others
References
G. A. Chadwick,Prog. Mat. Sci. 12 (1963) 99.
L. M. Hogan, R. W. Kraft andF. D. Lemkey,Adv. Mat. Res. 5 (1971) 83.
F. L. Kennard, R. C. Bradt andV. S. Stubican,J. Amer. Ceram. Soc. 56 (1973) 566.
L. Wegmann,J. Microscopy 96 (1972) 1.
K. H. Gaukler andR. Schwarzer,Messtechn. 81 (10) (1973) 307.
Ch. Zaminer,Optik 31 (1970) 116.
L. Weber,Schweiz. Min. Petr. Mitt. 52 (1972) 349.
E. N. Bunting,J. Nat. Bur. Stand. 4 (1930) 131.
J. Williamson andF. P. Glasser,Phys. Chem. Glasses 5 (1964) 52.
H. P. Rooksby andA. H. Mckeag,Trans. Faraday Soc. 37 (1941) 308.
H. F. W. Taylor,Amer. Minerol. 47 (1962) 932.
A. Schleede andA. Gruhl,Z. Elektroch. 29 (1923) 411.
G. R. Fonda,J. Phys. Chem. 44 (1940) 851.
K. A. Jackson, “Liquid metals and solidification” (ASM, Cleveland, Ohio, 1958).
J. D. Hunt andK. A. Jackson,Trans. Met. Soc. AIME 236 (1966) 843.
O. W. Floerke,Fortschr. Min. 44 (1967) 181.
P. Gordon, “Principles of phase diagrams in materials systems” (McGraw-Hill, New York, 1968).
B. E. Sundquist, R. Bruscato andL. F. Mon-Dolfo,J. Inst. Metals 91 (1962–63) 204.
H. M. Weart andD. J. Mack,Trans. Met. Soc. AIME 212 (1958) 664.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Weber, L., Oswald, H.R. Investigation of phase intergrowth morphologies in the system Zn2SiO4-SiO2 by photo-emission electron microscopy. J Mater Sci 10, 973–982 (1975). https://doi.org/10.1007/BF00823214
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF00823214