Abstract
Populations of F6 recombinant inbred lines, generated by single seed descent from a half diallel among eight bread wheat lines adapted to the East African highlands, were used to identify those crosses that were more likely to produce cultivars which combined resistance to yellow rust with improved yield. Crosses having the most resistant line as one parent offered the best prospect of success, particularly those which produced F1hybrids exhibiting better parent heterosis. For plot grain yield there was a highly significant correlation between the observed and predicted rankings of the recombinant inbred line populations for the proportion of individual lines equalling or surpassing the target value. For yellow rust severity, however, this correlation was non-significant when a target value of zero was used. Adopting a slightly less stringent target of 0.25, coupled with the omission of two aberrant populations, increased this correlation significantly. The plant breeding implications of these results are discussed.
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Hill, J., Wagoire, W., Ortiz, R. et al. Cross prediction in bread wheat germplasm using single seed descent lines. Euphytica 113, 65–70 (2000). https://doi.org/10.1023/A:1003985429998
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DOI: https://doi.org/10.1023/A:1003985429998