Abstract
Dark mode spectroscopy measurement provides accurate values of refractive index and thickness of thin film. This paper shows that precise determination of the positions of dark lines improves the accuracy of determination of listed quantities by one order of magnitude. Such improvement is of great importance for experimental studies and applications in the area of integrated optics.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Wei J. S., Westwood W. D.: Appl. Phys. Lett.32 (1978) 819.
Pištora J., Matyáš M., Jr., Nitsch K., Palasova A.: Czech. J. Phys. B37 (1987) 122.
Marchand P., Marmet L.: Rev. Sci. Instrum.54 (1933) 1034.
Born M., Wolf E.: Principles of Optics. Pergamon Press, London 1959.
Cody W. J., Fraser W., Hart J. F.: Numer. Math.12 (1968) 242.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Sikora, T., Bok, J. & Matyáš, M. Determining of dark line positions on laser beam spot. Czech J Phys 40, 984–989 (1990). https://doi.org/10.1007/BF01607286
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF01607286