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Evidence for a two-magnon process in the linewidth of thin metal films

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Czechoslovak Journal of Physics B Aims and scope

Abstract

The temperature dependence of the spinwave resonance linewidth in thin ferromagnetic metal films has been observed at 35 GHz in the temperature range 4 °K to 300 °K. The data are analyzed in terms of a two-magnon relaxation process induced by a planar inhomogeneity in the internal field of the film. The inhomogeneity is due to imperfections in the film structure introduced during deposition. The linewidth is found to decrease with increasing temperature in a manner similar to the temperature dependence of the magnetization with a mode dependence that is in reasonable agreement with the model proposed.

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Authors and Affiliations

  1. Department of Physics, The Ohio State University, 43210, Columbus, Ohio, USA

    P. E. Wigen & S. D. Brown (IBM resident study fellow)

  2. Department of Physics, Bowling Green State University, Bowling Green, Ohio, USA

    C. T. Shirkey

Authors
  1. P. E. Wigen
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  2. S. D. Brown
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  3. C. T. Shirkey
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Supported in part by the National Science Foundation.

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Wigen, P.E., Brown, S.D. & Shirkey, C.T. Evidence for a two-magnon process in the linewidth of thin metal films. Czech J Phys 21, 474–477 (1971). https://doi.org/10.1007/BF01691531

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  • DOI: https://doi.org/10.1007/BF01691531

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