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Anomalies of the static dielectric constant of Pb1−x Ge x Te

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Zeitschrift für Physik B Condensed Matter

Abstract

The static dielectric constant of Pb1−x Ge x Te (0≦x≦0.05) has been determined from differential capacitance measurements on Schottky-barriers in the temperature range of 4.2–300 K. A comparison with data deduced from the phonon frequencies via the Lyddane-Sachs-Teller relation shows substantial discrepancies which are attributed to lattice defects.

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Author information

Authors and Affiliations

  1. Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, D-7000, Stuttgart 80, Germany

    W. Jantsch

  2. Experimentalphysik II, Johannes-Kepler-Universität, A-4045, Linz, Austria

    H. Mitter & A. Lopez-Otero

Authors
  1. W. Jantsch
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  2. H. Mitter
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  3. A. Lopez-Otero
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Work supported by Jubiläumsfonds der Österreichischen Nationalbank

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Jantsch, W., Mitter, H. & Lopez-Otero, A. Anomalies of the static dielectric constant of Pb1−x Ge x Te. Z. Physik B - Condensed Matter 41, 287–290 (1981). https://doi.org/10.1007/BF01307317

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  • DOI: https://doi.org/10.1007/BF01307317

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