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Laser vibrometry based on analysis of the speckle pattern from a remote object

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Abstract

A novel technique is represented that allows one to measure vibrations from a distant object with micron and sub-micron amplitudes in real time.

The method is based on the speckle interference phenomena and speckle pattern analysis. The scheme allows us to use a single photodiode as a photo-detector and to obtain information from an analog signal without any additional post-processing, which significantly simplifies the device realization compared with the available today laser vibrometers based both on interferometric and on speckle pattern analysis principles.

The scheme investigated was implemented as a device and several studies of the practical applications were carried out.

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Authors and Affiliations

  1. General Physics Institute, GSP-1, Vavilov str., 38, Moscow, 119991, Russia

    A. A. Veber, A. Lyashedko, E. Sholokhov, A. Trikshev, A. Kurkov, Y. Pyrkov, A. E. Veber, V. Seregin & V. Tsvetkov

Authors
  1. A. A. Veber
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  2. A. Lyashedko
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  3. E. Sholokhov
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  4. A. Trikshev
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  5. A. Kurkov
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  6. Y. Pyrkov
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  7. A. E. Veber
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  8. V. Seregin
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  9. V. Tsvetkov
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Corresponding author

Correspondence to A. A. Veber.

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Veber, A.A., Lyashedko, A., Sholokhov, E. et al. Laser vibrometry based on analysis of the speckle pattern from a remote object. Appl. Phys. B 105, 613–617 (2011). https://doi.org/10.1007/s00340-011-4585-1

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  • DOI: https://doi.org/10.1007/s00340-011-4585-1

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