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Applications of Resonance Ionization Spectroscopy to Ultralow-Level Counting and Mass Spectroscopy*

Published online by Cambridge University Press:  18 July 2016

S D Kramer ,
G S Hurst ,
J P Young ,
M G Payne ,
M K Kopp ,
T A Callcott ,
E T Arakawa  and
D W Beekman
S D Kramer
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
G S Hurst
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
J P Young
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
M G Payne
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
M K Kopp
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
T A Callcott
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830 University of Tennessee, Knoxville, Tennessee 37916
E T Arakawa
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
D W Beekman
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830 University of Tennessee, Knoxville, Tennessee 37916
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Abstract

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In this paper it is shown that the ability to directly detect a daughter atom, using resonance ionization spectroscopy, in delayed time coincidence with the decay of a parent species promises to drastically reduce the background in low-level counting experiments. In addition, resonance ionization can also be used as an ion source for a mass spectrometer system that is capable of discriminating between isobars.

Type
Techniques
Information
Radiocarbon , Volume 22 , Issue 2 , 1980 , pp. 428 - 434
Copyright
Copyright © The American Journal of Science 

References

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