ExLibris header image
SFX Logo
Title: Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
Source:

Beilstein Journal of Nanotechnology [2190-4286] Wagner, Tino yr:2015


Collapse list of basic services Basic
Full text
Full text available via PubMed Central
GO
Document delivery
Request document via Library/Bibliothek GO
Users interested in this article also expressed an interest in the following:
1. Ruiz Vargas, Carlos S. "Contact+transfer+length+investigation+of+a+2D+nanoparticle+network+by+scanning+probe+microscopy." Nanotechnology 26.36 (2015): 365701-. Link to Full Text for this item Link to SFX for this item
Select All Clear All

Expand list of advanced services Advanced