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Title:
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
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Beilstein Journal of Nanotechnology [2190-4286] Wagner, Tino yr:2015
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Wagner, Tino
Beyer, Hannes
Reissner, Patrick
Mensch, Philipp
Riel, Heike
Gotsmann, Bernd
Stemmer, Andreas
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author:
Wagner, Tino
Beyer, Hannes
Reissner, Patrick
Mensch, Philipp
Riel, Heike
Gotsmann, Bernd
Stemmer, Andreas
last name
initials
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