Abstract
The measurements of the loss parameter in terms of the effective linewidth ( Delta Heff) in two MgMn ferrite samples have been reported at the X band by using the magneto-microwave Kerr effect (MMKE). The effect of the sample thickness on Delta Heff has been examined experimentally at low power levels. It has been found that Delta Heff has a linear dependence on the thickness. The value of Delta Heff extrapolated to zero thickness is the same as that expected from conventional cavity techniques.