Abstract
The crystal-glass transition of alternating layers of pure Zr and Co has been observed by in situ X-ray diffraction using a hot stage in the diffractometer. The analysis of the intensities proves the total mass conservation for the transition of crystalline Co and Zr into amorphous ZrCo without any other phases occuring. The planar growth of the amorphous phase allows detailed information of the concentration, the growth velocity and the interdiffusion coefficient. Recrystallization in the crystalline layers during the solid-state reaction process is combined with a release of tensile stresses in the Zr layers. This affects the kinetic path of the reaction and depends most likely on the deposition temperature.