Abstract
Distinct and novel features of nanometric electric topological defects, including dipole waves and dipole disclinations, are presently revealed in the layers of multilayer films by means of quantitative high-resolution scanning transmission electron microscopy. These original dipole configurations are confirmed and explained by atomistic simulations and have the potential to act as functional elements in future electronics.
- Received 17 November 2017
- Revised 9 February 2018
DOI:https://doi.org/10.1103/PhysRevLett.120.177601
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