Mechanisms of defect pairing in semiconductors: A study for chalcogens in silicon

Carl M. Weinert and Matthias Scheffler
Phys. Rev. Lett. 58, 1456 – Published 6 April 1987
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Abstract

Electronic-structure and total-energy calculations are reported for the vacancy and the substitutional and interstitial S, Se, and Te impurities in Si. We identify several mechanisms of impurity-impurity interactions. This theoretical study also serves to determine the dominant defect site of chalcogen pairs as two substitutionals.

  • Received 5 January 1987

DOI:https://doi.org/10.1103/PhysRevLett.58.1456

©1987 American Physical Society

Authors & Affiliations

Carl M. Weinert and Matthias Scheffler

  • Physikalisch-Technische Bundesanstalt, D-3300 Braunschweig, Federal Republic of Germany

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Issue

Vol. 58, Iss. 14 — 6 April 1987

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