Level Structure of Ga66

H. Bakhru and I. M. Ladenbauer-Bellis
Phys. Rev. 184, 1142 – Published 20 August 1969
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Abstract

The excited levels of Ga66 have been investigated from the decay of Ge66 with high resolution Ge(Li) and Si(Li) detectors and with standard scintillation counters. Ge66 was produced by the (α,2n) reaction on enriched Zn64. A chemical separation for Ge was performed. γ rays of the following energies (in keV) and intensities have been assigned to the decay of Ge66: 44.3±0.5 (70), 65±0.5 (17), 91±0.5 (2), 109.3±0.5 (43), 125±0.5 (1), 148±0.5 (1), 155±0.5 (<1), 168±1 (%1), 182±0.5 (26), 190±0.5 (25), 234.5±1 (<1), 246±0.5 (24), 272±0.5 (40), 291±1 (1), 303±1 (10), 324±1 (<1), 338±1 (22), 382±1 (100), 414±1 (2), 428±1 (2), 471±1 (43), 493±1 (3), 537±1 (25), 574±1 (1.5), 595.5±1 (2.5), 638±1 (3.5), 661±1 (2.5), 705±1 (21), 756+1 (5), 821±1 (∼1), and 865±1 (3) keV. The use of two Ge(Li) detectors in coincidence studies has revealed the presence of several previously unreported transitions. Based on these results, a consistent level scheme of Ga66 is given. The spin and parity assignments of some of the low excited levels of Ga66 are discussed. The half-lives of the 44.3- and 109.3-keV levels have been measured by delayed coincidence to be (12±1)×109 sec and (1.2×0.2)×109 sec, respectively.

  • Received 23 December 1968

DOI:https://doi.org/10.1103/PhysRev.184.1142

©1969 American Physical Society

Authors & Affiliations

H. Bakhru and I. M. Ladenbauer-Bellis

  • Yale University, New Haven, Connecticut 06520

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Issue

Vol. 184, Iss. 4 — August 1969

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