Singularity spectra of rough growing surfaces from wavelet analysis

M. Ahr and M. Biehl
Phys. Rev. E 62, 1773 – Published 1 August 2000
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Abstract

We apply the wavelet transform modulus maxima method [A. Arnéodo, N. Decoster, and S. G. Roux, Phys. Rev. Lett. 83, 1255 (1999)] to the analysis of simulated surfaces grown by molecular-beam epitaxy. In contrast to the structure function approach commonly used in the literature, this method permits an investigation of the complete singularity spectrum. We focus on a kinetic Monte Carlo model with Arrhenius dynamics, which in particular takes into consideration the process of thermally activated desorption of particles. We find a wide spectrum of Hölder exponents, which reflects the multiaffine surface morphology. Although our choice of parameters yields small desorption rates (<3%), we observe a dramatic change in the singularity spectrum, which is shifted toward smaller Hölder exponents. Our results offer a mathematical foundation of anomalous scaling: We identify the global exponent αg with the Hölder exponent that maximizes the singularity spectrum.

  • Received 13 January 2000

DOI:https://doi.org/10.1103/PhysRevE.62.1773

©2000 American Physical Society

Authors & Affiliations

M. Ahr* and M. Biehl

  • Institut für Theoretische Physik, Julius-Maximilians-Universität Würzburg, Am Hubland, 97074 Würzburg, Germany

  • *Email address: ahr@physik.uni-wuerzburg.de

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Vol. 62, Iss. 2 — August 2000

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