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Microwave and far-infrared induced optically detected cyclotron resonance in epitaxial InP and GaAs

A. Moll, C. Wetzel, B. K. Meyer, P. Omling, and F. Scholz
Phys. Rev. B 45, 1504(R) – Published 15 January 1992
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Abstract

A comparative study of optically detected cyclotron resonance in the microwave and far-infrared frequency range in epitaxial InP and GaAs is presented. The electron cyclotron resonances and the inter-impurity 1s-to-2p+ transitions are observed in both high-mobility layers. Cyclotron-resonance-induced impact ionization of shallow donors and bound excitons is the basic mechanism for the observation by photoluminescence.

  • Received 30 September 1991

DOI:https://doi.org/10.1103/PhysRevB.45.1504

©1992 American Physical Society

Authors & Affiliations

A. Moll, C. Wetzel, and B. K. Meyer

  • Physik-Department, E 16, Technische Universita¨t Mu¨nchen, D-8046 Garching, Germany

P. Omling

  • Department of Solid State Physics, University of Lund, Box 118, S-22100 Lund, Sweden

F. Scholz

  • Physikalisches Institut, Universita¨t Stuttgart, Pfaffenwaldring 57, D-7000 Stuttgart, Germany

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Vol. 45, Iss. 3 — 15 January 1992

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