Theoretical studies of Si vapor-phase epitaxial growth by Iab initioP molecular-orbital calculations

Yoshio Ohshita, Akihiko Ishitani, and Toshikazu Takada
Phys. Rev. B 41, 12720 – Published 15 June 1990
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Abstract

The mechanism of Si vapor-phase epitaxial growth is studied by using abnitio molecular-orbital calculations. Since SiCl2 is a dominant species in the thermal decomposition of SiH2Cl2, it is considered to be the key adsorbate of the epitaxial growth. Therefore, the potential curves of the SiCl2 and Si cluster (Si11H18) system are calculated. In the present calculations, the adsorption of SiCl2 is assumed to occur at the hollow bridge site. Depending on the electronic structures of the hollow bridge site, three different types of potential curves that have a minimum are obtained. The first one corresponds to the chemisorption of SiCl2 in which the electronic structure is closed-shell singlet. The binding energy is calculated to be about 146.7 kcal/mol. The second whose electronic state is triplet has a shallow minimum of about 4.6 kcal/mol. The last one is the potential curve of the charge-transfer state from the cluster to SiCl2, which is considered to be important to enhancement of the growth rate by the emission of ultraviolet lights during the vapor-phase-epitaxy process.

  • Received 5 March 1990

DOI:https://doi.org/10.1103/PhysRevB.41.12720

©1990 American Physical Society

Authors & Affiliations

Yoshio Ohshita, Akihiko Ishitani, and Toshikazu Takada

  • Fundamental Research Laboratories, NEC Corporation, 4-1-1 Miyazaki, Miyamae-ku, Kawasaki 213, Japan

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Vol. 41, Iss. 18 — 15 June 1990

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