Abstract
Equations are derived for the effects of x-ray birefringence at a molecular scale on the intensity of scattering by isotropic amorphous materials. These effects introduce false detail into radial distribution functions calculated by the usual Fourier transformation. They may compromise multiple-wavelength techniques for measuring partial pair distribution functions. They may be a probe of electronic structure and bonding.
- Received 26 May 1989
DOI:https://doi.org/10.1103/PhysRevB.40.6505
©1989 American Physical Society