The M-edge resonant magneto-optical Kerr effect of a transition metal film was measured using rotating analyzer ellipsometry and compared with theoretical calculations based on resonant scattering theory. A large Kerr rotation angle of over 10 was observed at room temperature.
DOI:https://doi.org/10.1103/PhysRevB.89.064423
©2014 American Physical Society
(a) A schematic of a 15-nm-thick Ni film. (b) X-ray absorption (XAS) spectrum (solid line) and (c) X-ray magnetic circular dichroism (XMCD) spectrum of the Ni sample shown in (a) with magnetic field (0.47 T) applied along the surface normal. The integration value in (b) and (c) is given along the dotted line.
Reuse & Permissions(a) X-ray absorption spectrum (XAS), (b) Kerr rotation (), and (c) ellipticity () of the Ni crystal at the saturated magnetization, calculated based on the CI model without the Fano effect. (d) XAS, (e) Kerr rotation (), and (f) ellipticity () of the Ni crystal at the saturated magnetization, calculated the same way as in (a), (b), and (c) but with the Fano effect.
Reuse & PermissionsIllustration of the polar magneto-optical Kerr effect. After reflection from a magnetized material, linearly polarized fight is elliptically polarized and the main polarization plane is tilted over a small angle with respect to that of the incident light. The ellipticity of the reflected light is quantified by .
Reuse & Permissions(a) Geometry for rotating-analyzer ellipsometry (RAE) to measure the polar MOKE. The light beam is polarized by the surface, and the magnetic field () is applied along the surface normal. (b) Typical results of the intensity variation with rotation angle, , taken at eV. The Kerr rotation angle, , can be determined from 2= .
Reuse & PermissionsPhoton energy dependence of the Kerr rotation angle, , of the Ni film calculated with the cluster model (sim.) and measured experimentally with VUV synchrotron radiation (exp.). Measurement was performed at room temperature under a magnetic field of T. The calculated Kerr rotation angle in Fig. 2 is reduced to 67 to compensate the difference of total magnetic moment, determined with XMCD (Fig. 2).
Reuse & Permissions(a) Normalized intensity () as a function of rotation angle, , taken at SASE-FEL beamline. The incident photon energy was set at and 66.0 eV with an intensity ratio of 1:1. (b) Normalized intensity at the maximum intensity angle in (a) as a function of delay time on a Ni sample under a magnetic field of T. The solid line is an exponential fit with relaxation time as indicated. The experimental data are plotted with error bars.
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