Geometrically enhanced extraordinary magnetoresistance in semiconductor-metal hybrids

T. H. Hewett and F. V. Kusmartsev
Phys. Rev. B 82, 212404 – Published 13 December 2010

Abstract

Extraordinary magnetoresistance (EMR) arises in hybrid systems consisting of semiconducting material with an embedded metallic inclusion. We have investigated such systems with the use of finite-element modeling, with our results showing good agreement to existing experimental data. We show that this effect can be dramatically enhanced by over four orders of magnitude as a result of altering the geometry of the conducting region. The significance of this result lies in its potential application to EMR magnetic field sensors utilizing more familiar semiconducting materials with nonoptimum material parameters, such as silicon. Our model has been extended further with a geometry based on the microstructure of the silver chalcogenides, consisting of a randomly sized and positioned metallic network with interspersed droplets. This model has shown a large and quasilinear magnetoresistance analogous to experimental findings.

    • Received 25 August 2010

    DOI:https://doi.org/10.1103/PhysRevB.82.212404

    ©2010 American Physical Society

    Authors & Affiliations

    T. H. Hewett* and F. V. Kusmartsev

    • Department of Physics, Loughborough University, Loughborough LE11 3TU, United Kingdom

    • *t.h.hewett@lboro.ac.uk

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    Issue

    Vol. 82, Iss. 21 — 1 December 2010

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