Probing the valley filtering effect by Andreev reflection in a zigzag graphene nanoribbon with a ballistic point contact

Kun Luo, Tao Zhou, and Wei Chen
Phys. Rev. B 96, 245414 – Published 18 December 2017

Abstract

The ballistic point contact (BPC) with zigzag edges in graphene is a main candidate for a valley filter, in which the polarization of the valley degree of freedom can be selected by using a local gate voltage. Here, we propose to detect the valley filtering effect by Andreev reflection. By using both scattering matrix analysis and numerical simulation, we show that Andreev reflection is strongly suppressed as the incident electron and reflected hole propagate through different bands of BPC with opposite chirality. The conductance as a function of both the incident energy of electron and the local gate voltage at the BPC is obtained, with which the parametric region for a perfect valley filter and the direction of the valley polarization can be determined. As the length of the BPC increases, the conductance exhibits an oscillatory decay behavior, indicating a negative correlation between Andreev reflection and valley polarization.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 5 July 2017
  • Revised 27 September 2017

DOI:https://doi.org/10.1103/PhysRevB.96.245414

©2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Kun Luo, Tao Zhou, and Wei Chen*

  • College of Science, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China

  • *Corresponding author: weichenphy@nuaa.edu.cn

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 96, Iss. 24 — 15 December 2017

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×