Ion-by-ion measurements of backward secondary electron emission of carbon foilsunder the impact of MeV H+, H0, H, and H2+ projectiles

A. Billebaud, M. Fallavier, R. Kirsch, J.-C. Poizat, J. Remillieux, and Z. Vidovic-acute
Phys. Rev. A 55, 1124 – Published 1 February 1997
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Abstract

We have experimentally studied the backward electron emission from solid carbon bombarded by H+, H0, H, and H2+ projectiles at MeV energies. We used a coincidence ion-by-ion technique that allows us to obtain not only the average electron yields but also the emission statistics. The comparison of energy dependences of electron emission due to H+ and H0 projectiles helps to specify the role of the incident electron of H0. For H and H2+, the equality of electron yields above 500 keV/u supports the idea that backward emission is due to distant collisions.

  • Received 30 July 1996

DOI:https://doi.org/10.1103/PhysRevA.55.1124

©1997 American Physical Society

Authors & Affiliations

A. Billebaud, M. Fallavier, R. Kirsch, J.-C. Poizat, J. Remillieux, and Z. Vidovic-acute

  • Institut de Physique Nucléaire de Lyon, IN2P3/CNRS, UniversitéClaude Bernard 43, Boulevard du 11 Novembre 1918,

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Vol. 55, Iss. 2 — February 1997

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