ExLibris header image
SFX Logo
Title: Method of characterization of dielectric or semiconductor materials using an optically pumped far infrared waveguide laser
Source:

Review of Scientific Instruments [0034-6748] Decoster, Didier yr:1980


Collapse list of basic services Basic
Full text
Full text available via AIP Digital Archive
GO
Full text available via AIP Journals (American Institute of Physics)
GO
Document delivery
Request document via Library/Bibliothek GO

Expand list of advanced services Advanced