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Title:
Calibrated nanoscale dopant profiling using a scanning microwave microscope
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Journal of Applied Physics [0021-8979] Huber, H P yr:2012
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author:
Huber, H P
Humer, I
Hochleitner, M
Fenner, M
Moertelmaier, M
Rankl, C
Imtiaz, A
Wallis, T M
Tanbakuchi, H
Hinterdorfer, P
Kabos, P
Smoliner, J
Kopanski, J J
Kienberger, F
last name
initials
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author:
Huber, H P
Humer, I
Hochleitner, M
Fenner, M
Moertelmaier, M
Rankl, C
Imtiaz, A
Wallis, T M
Tanbakuchi, H
Hinterdorfer, P
Kabos, P
Smoliner, J
Kopanski, J J
Kienberger, F
last name
initials
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Web of Science
author:
Huber, H P
Humer, I
Hochleitner, M
Fenner, M
Moertelmaier, M
Rankl, C
Imtiaz, A
Wallis, T M
Tanbakuchi, H
Hinterdorfer, P
Kabos, P
Smoliner, J
Kopanski, J J
Kienberger, F
last name
initials
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