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Title: Influence of hydrogen effusion from hydrogenated silicon nitride layers on the regeneration of boron-oxygen related defects in crystalline silicon
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Journal of Applied Physics [0021-8979] Wilking, S yr:2013


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1. Yli Koski, M. "Light activated copper defects in P-type silicon studied by PCD." Physica scripta. T T114 (2004): 69-72. Link to SFX for this item
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