ExLibris header image
SFX Logo
Title: Visualizing metal/HfO2/SiO2/Si(001) interface electrostatic barrier heights with ballistic hole emission microscopy
Source:

Journal of Applied Physics [0021-8979] Rogers, Jack yr:2019


Collapse list of basic services Basic
Holding information
Holdings in library search engine ALBERT GO
Document delivery
Request document via Library/Bibliothek GO

Expand list of advanced services Advanced