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Title:
Observation of lattice relaxation at the GaAsP/GaAs interface beyond the critical thickness by transmission electron microscopy
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Journal of Applied Physics [0021-8979] Soga, Tetsuo yr:1994
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Soga, Tetsuo
Inoue, Jiro
Jimbo, Takashi
Umeno, Masayoshi
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Inoue, Jiro
Jimbo, Takashi
Umeno, Masayoshi
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Inoue, Jiro
Jimbo, Takashi
Umeno, Masayoshi
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