ExLibris header image
SFX Logo
Title: Transport Properties, Microstructure, and Conduction Model of Cosputtered Au–SiO2 Cermet Films
Source:

Journal of Applied Physics [0021-8979] Miller, N C yr:1970


Collapse list of basic services Basic
Full text
Full text available via AIP Digital Archive
GO
Document delivery
Request document via Library/Bibliothek GO
Users interested in this article also expressed an interest in the following:
1. Gau, D. J. S. "Structure and properties of oblique‐deposited magnetic thin films." Journal of applied physics 61.8 (1987): 3807-5014. Link to Full Text for this item Link to SFX for this item
2. Abelmann, L. "Oblique evaporation and surface diffusion." Thin solid films 305.1 (1997): 1-21. Link to Full Text for this item Link to SFX for this item
3. Dobierzewska Mozrzymas, E. "Conduction mechanisms in discontinuous Pt films." Crystal research and technology 36.8-10 (2001): 1137-1144. Link to Full Text for this item Link to SFX for this item
4. ONO, H. "TEXTURE, MICROSTRUCTURE, AND MAGNETIC-PROPERTIES OF FE-CO ALLOY-FILMS FORMED BY SPUTTERING AT AN OBLIQUE ANGLE OF INCIDENCE." Journal of applied physics 74.8 (1993): 5124-5128. Link to Full Text for this item Link to SFX for this item
5. Wang, H. "Strong surface diffusion mediated glancing-angle deposition: Growth, recrystallization and reorientation of tin nanorods." Chinese Physics Letters 25.1 (2008): 234-237. Link to Full Text for this item Link to SFX for this item
6. Singh, J. "Nano and macro-structured component fabrication by electron beam-physical vapor deposition (EB-PVD)." Journal of materials science 40.1 (2005): 1-26. Link to Full Text for this item Link to SFX for this item
7. Yuan, H. "Using fugacity to predict volatile emissions from layered materials with a clay/polymer diffusion barrier." Atmospheric environment 41.40 (2007): 9300-9308. Link to SFX for this item
Select All Clear All

Expand list of advanced services Advanced