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Title:
Measuring low loss dielectric substrates with scanning probe microscopes
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Applied Physics Letters [0003-6951] Hoffmann, Johannes yr:2014
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author:
Hoffmann, Johannes
Gramse, Georg
Niegemann, Jens
Zeier, Markus
Kienberger, Ferry
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author:
Hoffmann, Johannes
Gramse, Georg
Niegemann, Jens
Zeier, Markus
Kienberger, Ferry
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initials
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author:
Hoffmann, Johannes
Gramse, Georg
Niegemann, Jens
Zeier, Markus
Kienberger, Ferry
last name
initials
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