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Title:
Determination of the critical layer thickness in the InGaN/GaN heterostructures
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Applied Physics Letters [0003-6951] Parker, C A yr:1999
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Parker, C A
Roberts, J C
Bedair, S M
Reed, M J
Liu, S X
El-Masry, N A
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Parker, C A
Roberts, J C
Bedair, S M
Reed, M J
Liu, S X
El-Masry, N A
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Parker, C A
Roberts, J C
Bedair, S M
Reed, M J
Liu, S X
El-Masry, N A
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