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Title:	Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy
Source:	Applied Physics Letters [0003-6951] Griggio, F yr:2011

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description	1.	Anczykowski, B. "How to measure energy dissipation in dynamic mode atomic force microscopy." Applied surface science 140.3 (1999): 376-382.
description	2.	Kumar, A. "Real-space mapping of dynamic phenomena during hysteresis loop measurements: Dynamic switching spectroscopy piezoresponse force microscopy." Applied physics letters 98.20 (2011): 202903-.
description	3.	Cleveland, J.P. P. "Energy dissipation in tapping-mode atomic force microscopy." Applied physics letters 72.20 (1998): 2613-2615.
description	4.	Ovchinnikov, O. "Mapping Octahedral Tilts and Polarization Across a Domain Wall in BiFeO3 from Z-Contrast Scanning Transmission Electron Microscopy Image Atomic Column Shape Analysis." ACS nano 4.10 (2010): 6071-6079.
description	5.	Rubio-Sierra, FJ. "Transfer function analysis of the micro cantilever used in atomic force microscopy." IEEE transactions on nanotechnology 5.6 (2006): 692-700.
description	6.	Tamayo, J. "Energy dissipation in tapping-mode scanning force microscopy with low quality factors." Applied physics letters 75.22 (1999): 3569-3571.
description	7.	Jalili, N. "A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences." Mechatronics 14.8 (2004): 907-945.
description	8.	Asay, H. "Effects of adsorbed water layer structure on adhesion force of silicon oxide nanoasperity contact in humid ambient." The Journal of chemical physics 124.17: 174712-5.
description	9.	Garcı́a, R. "Dynamic atomic force microscopy methods." Surface Science Reports 47.6-8 (2002): 197-301.
description	10.	Croce, R. "Excited state equilibration in the Photosystem I light-harvesting I complex: P700 is almost isoenergetic with its antenna." Biochemistry 35.26 (1996): 8572-8579.
description	11.	Green, John Elie P. "Frequency response of cantilever beams immersed in viscous fluids near a solid surface with applications to the atomic force microscope." Journal of applied physics 98.11 (2005): 114913-76.
description	12.	Ikai, A. "STM and AFM of bio/organic molecules and structures." Surface science reports 26.8 (1996): 263-332.
description	13.	Butt, H. "Force measurements with the atomic force microscope: Technique, interpretation and applications." Surface Science Reports 59.1-6 (2005): 1-152.
description	14.	Rabinovich, I. "Capillary forces between surfaces with nanoscale roughness." Advances in colloid and interface science 96.1-3: 213-230.
description	15.	Jesse, S. "The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale." Nanotechnology 18.43 (2007): 35503-.
description	16.	Ranjith, R. "dc leakage behavior and conduction mechanism in (BiFeO3)(m)(SrTiO3)(m) superlattices." Applied physics letters 92.23 (2008): 232905-.
description	17.	Ikuhara, T. "Direct Determination of Dopant Site Selectivity in Ordered Perovskite CaCu3Ti4O12 Polycrystals by Aberration-Corrected STEM." Advanced materials 21.8 (2009): 885-889.
description	18.	Weeks, Brandon L. "Direct imaging of meniscus formation in atomic force microscopy using environmental scanning electron microscopy." Langmuir 21.18 (2005): 8096-8098.
description	19.	BINGGELI, M. "INFLUENCE OF CAPILLARY CONDENSATION OF WATER ON NANOTRIBOLOGY STUDIED BY FORCE MICROSCOPY." Applied physics letters 65.4 (1994): 415-417.
description	20.	Stark, M. "Estimating the transfer function of the cantilever in atomic force microscopy: A system identification approach." Journal of applied physics 98.11 (2005): 114904-114904.