ExLibris header image
SFX Logo
Title: Characterization of Si/GexSi1−x structures by micro-Raman imaging
Source:

Applied Physics Letters [0003-6951] Nakashima, S yr:2004


Collapse list of basic services Basic
Full text
Full text available via AIP Journals (American Institute of Physics)
GO
Document delivery
Request document via Library/Bibliothek GO

Expand list of advanced services Advanced
A service provided by the Library of the Wissenschaftspark Albert Einstein, Potsdam, Germany.
© 2005 SFX by Ex Libris Inc.