ExLibris header image
SFX Logo
Title: Surface Motion Measurements on Surface Elastic Waves
Source:

Applied Physics Letters [0003-6951] Lawrence, M W yr:1972


Collapse list of basic services Basic
Full text
Full text available via AIP Digital Archive
GO
Full text available via AIP Journals (American Institute of Physics)
GO
Document delivery
Request document via Library/Bibliothek GO
Users interested in this article also expressed an interest in the following:
1. Haydl, William H. "Acoustic‐surface‐wave dispersion in periodically metallized structures." Journal of applied physics 46.7 (1975): 3219-3220. Link to Full Text for this item Link to SFX for this item
2. KOVNOVICH, S. "Surface‐acoustic‐wave film thickness monitor." Review of scientific instruments 48.7 (1977): 920-922. Link to Full Text for this item Link to SFX for this item
3. YAMASHITA, M. "Measurements of Thickness and Sputtering Yields of Thin Films Using a SAW Device." 真空 25.4 (1982): 249-252. Link to SFX for this item
Select All Clear All

Expand list of advanced services Advanced