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Title:
Characterization of the near‐interface region of chemical vapor deposited diamond films on silicon by backscatter Kikuchi diffraction
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Applied Physics Letters [0003-6951] Geier, S yr:1994
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Geier, S
Schreck, M
Hessmer, R
Rauschenbach, B
Stritzker, B
Kunze, K
Adams, B L
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author:
Geier, S
Schreck, M
Hessmer, R
Rauschenbach, B
Stritzker, B
Kunze, K
Adams, B L
last name
initials
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author:
Geier, S
Schreck, M
Hessmer, R
Rauschenbach, B
Stritzker, B
Kunze, K
Adams, B L
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