Abstract
We have investigated the influence of drawing on orientation, crystallinity, and structural properties of polyamide 6 films using X-ray diffraction. The samples were uniaxially and biaxially stretched resulting in the formation of monoclinic crystallites (α-form) in the size range of 8–10 nm. Depending on the drawing ratio, a degree of crystallinity of up to 60% is obtained. The average orientation of the crystallite axes was evaluated using the pole figure technique. The b*-axis, which corresponds to the chain direction of the polyamide molecules, lies in the film plane and shows a preferred orientation upon drawing. For uniaxial drawing, b* aligns with the drawing direction. For biaxially drawn films, which were prepared using the sequential stretching method, the second drawing determines the orientation of b*, at least at the center of the films. At the sides, b* is located between the two drawing directions reflecting the inhomogeneous distribution of mechanical stress during stretching.
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Appendix
Appendix
Some sample rotations were done during the measurement of the X-ray diffractograms in order to be sure about indexing the film reflections, to detect more peaks, and to separate the overlapping ones. In general, the rotations were done in κ and β angles as sketched in Fig. 14a. Figure 14b shows the transmission intensity of the XRD patterns of the biaxially drawn film taken from the left side (L; see Fig. 2b). The film was continuously spun in κ angle during the measurement. A comparison with Figs. 4 and 5 shows that new peaks appear.
Figure 15 presents the transmission XRD patterns of the same film, but now the angle β was fixed at +30, 0, and −30 degrees during the 2θ scan. At β = −30°, the peaks 200 at 2θ = 20.5° and 002/202 at 2θ = 24.05°, which were previously overlapping (at 2θ = 20°–25°), can be separated. In Fig. 16, the angle κ was changed and β was kept constant at 30°. So it was possible to separate the 200 and 002 peaks, and to detect others such as the 006 peak, especially at β = 30° and κ = 45°.
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Shanak, H., Ehses, KH., Götz, W. et al. X-ray diffraction investigations of α-polyamide 6 films: orientation and structural changes upon uni- and biaxial drawing. J Mater Sci 44, 655–663 (2009). https://doi.org/10.1007/s10853-008-3062-7
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DOI: https://doi.org/10.1007/s10853-008-3062-7