Abstract
We explote and empirical relationship between strain (and lattice constant) and the valence electronic structure for mercury, bromine and iron overlayers. These overlayers have a range of lattice constants. For the Hg overlayers, all share a common cubic crystallography. We generally observe that the smaller the overlayer lattice constant, the greater the energy separation betweend-bands (Hg and Fe) orp-bands (Br). These results have important implications in relating electronic structure to fundamental properties such as magnetism. In addition, the film thickness limits for pseudomorphic growth calculated from the bulk properties are consistent with the experimental studies of Hg pseudomorphic growth on Ag (100) at 90 K.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Onellion, M., Kime, Y.J., Dowben, P.A., Tache, N.: J. Phys. C. Solid State Phys.20, L633 (1987)
Jansen, H.J.F., Freeman, A.J., Weinert, M., Wimmer, E.: Phys. Rev. B28, 593 (1983)
Onellion, M., Erskine, J.L., Kime, Y.J., Varma, Shikha, Dowben, P.A.: Phys. Rev. B33, 8833 (1986)
Dowben, P.A., Kime, Y.J., Varma, Shikha, Onellion, M., Erskine, J.L.: Phys. Rev. B36, 2519 (1987)
Dowben, P.A.: CRC Crit. Rev. Solid State Mater. Sci.13, 191 (1987)
Mueller, D., Rhodin, T.N., Dowben, P.A.: Ber. Bunsenges. Phys. Chem.90, 281 (1986)
Dowben, P.A., Onellion, M., Kime, Y.J.: Scanning Micros.2, 177 (1988)
Jones, R.G., Perry, D.L.: Vacuum31, 493 (1981)
Jones, R.G., Perry, D.L.: Surf. Sci.71, 59 (1979)
Jones, R.G., Perry, D.L.: Surf. Sci.82, 540 (1979)
Clarke, A., Rous, P.A., Arnoff, M., Jennings, G., Willis, R.F.: Surface Sci.192, L843 (1987)
Onellion, M., Thompson, M.A., Erskine, J.L., Duke, C.B., Daton, A.: Surface Sci.179, 219 (1987)
Gradmann, U., Tillmanns, P.: Phys. Status Solidi A44, 539 (1977)
Smith, G.C., Dadmore, H.A., Norris, C.: Surf. Sci.119, 287 (1982)
Jonker, B.T., Walker, K.H., Kisker, E., Prinz, G.A., Carbone, C.: Phys. Rev. Lett.57, 142 (1986)
Gradmann, U., Waller, G.: Surf. Sci.116, 539 (1982)
Kurzawa, R., Kamper, K.P., Schmitt, W., Gunthrodt, G.: Solid State Commun.60, 777 (1986)
van der Merwe, J.H.: J. Appl. Phys.41, 4725 (1970)
van der Merwe, J.H.: Treatise on material science and technology. Herman, H. (Ed.), Vol. 2, p. 90. New York: Academic Press 1973
Markov, I., Stoyanov, S.: Contemp. Phys.28, 267 (1987)
Miedema, A.R., Dorleijn, J.W.F.: Philos. Mag. B43, 251 (1981)
Jones, R.G., Tong, A.W.-L.: Surf Sci.188, 87 (1987)
Ross, N.D.H., Abell, J.S.: Phys. Status Solidi A1, K33 (1970)
Donohue, J.: The structure of the elements. New York: Wiley 1974
Hearmon, R.F.S.: Adv. Phys.5, 323 (1956) 255-1,E and Poisson's ratio are at 83° K and are determined by Voigt averages)
For Tungsten an estimate ofg=1/3 is clearly very good since the surface diffusion activation barrier for Hg on W is 1.0 eV≈ 1/3E d
Swanson, L.W., Strayer, R.W., Davis, L.E.: Surf. Sci.9, 165 (1968)
Simmons, G., Wang, H.: Single crystal elastic const. and calculated Aggregate properties: A handbook. Cambridge, Mass.: MIT Press 1971
Worster, J., March, N.H.: Solid State Commun.2, 245 (1964)
Egelhoff, W.F., Perry, D.L., Linnett, J.W.. Surf. Sci.54, 670 (1976)
Becker, G.E., Hagstrum, H.G.: J. Vac. Sci. Technol10, 31 (1973)
Svensson, S., Martensson, N., Basilier, E., Malqvist, P.A., Gelius, U., Siegbhan, K.: J. Electron Spectrosc. Relat. Phenom.9, 51 (1976)
Neighbours, J.R., Alers, G.A.: Phys. Rev.111, 707 (1958). The value of 255-2 and Poisson' Ratio of Ag are taken 100°K
Crocker, A.G., Singleton, G.A.A.M.: Phys. Status Solidi (a)6, 635 (1971)
Jesser, W.A., Wilsdorf D., Kuhlmann: Phys. Status Solidi19, 95 (1967)
Onellion, M., Dowben, P.A., Erskine, J.L.: Phys. Rev. A130, 171 (1988)
List, R.S., Woicik, J.C., Lindau, I., Spicer, W.E.: J. Vac. Sci. Technol. B5, 1279 (1987)
Mueller, D., Sakisaka, Y., Rhodin, T.N.: J. Vac. Sci. Technol. A2, 1018 (1984)
Mueller, D., Rhodin, T.N., Dowben, P.A.: (in preparation)
Dowben, P.A., Mueller, D., Rhodin, T.N., Sakisaka, Y.: Surf. Sci.155, 567 (1985)
Dowben, P.A., Jones, R.J.: Surf. Sci.88, 348 (1979)
Jones, R.G.: Dissertation. University of Cambridge 1978
Bailar, J.D., Emeleus, H.J., Nyholm, R., Trotzmann, Dickenson, A.F.: Comprehensive inorganic chemistry. New York: Pergamon Press 1973
Handbook of Chemistry and Physics, 51 st ed. Weast, R.C. (ed.), p. D-146. Cleveland, Ohio: Cleveland 1971
Moruzzi, V.L., Marcus, P.M., Schwarz, K., Mohn, P.: Phys. Rev. B34, 1784 (1986)
Moruzzi, V.L.: Private communication
Jansen, H.F.J., Hathaway, K.B., Freeman, A.J.: Phys. Rev. B30, 6177 (1984)
Legg, K.O., Jona, F., Jepsen, D.W., Marcus, P.M.: J. Phys. C10, 937 (1977)
Dowben, P.A.: Dissertation. University of Cambridge 1981
Houston, J.E., Peden, C.H.F., Feibelman, P.J., Hamann, D.R.: Phys. Rev. Lett56, 375 (1986)
Dowben, P.A., Driscoll, D.C., Tate, Ranjeet., Boag, N.M.: Organometallics7, 305 (1988)
Marcus, P.M., Moruzzi, V.L.: J. Appl. Phys.63, 4054 (1988)
Steigerwald, D.A., Egelhoff, W.F. Jr.: Surf Sci.192, L887 (1987)
Steigerwald, D.A., Egelhoff, W.F. Jr.: (to be published)
Onellion, M.F., Fu, C.L., Thompson, M.A., Erskine, J.L., Freeman, A.J.: Phys. Rev. B33, 7322 (1986)
Anderson, P.W.: Mater. Res. Bull.8, 153 (1973); Fazekas, P., Anderson, P.W.: Philos, Mag.30, 423 (1974)
Mermin, N.D., Wagner, H.: Phys. Rev. Lett.17, 1133 (1966)
Tadayasu, Mitsui, Tomizuka, C.T.: Phys. Rev.137, A565 (1965)
Turner, A.M., Erskine, J.L.: Phys. Rev. B30, 6675 (1985)
Schroder, K., Prinz, G.A., Walker, K.H., Kisker, E.: J. Appl. Phys.57, 3669 (1985)
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Dowben, P.A., Varma, S., Kime, Y.J. et al. The correlation between strain and electronic structure in monolayer thick films. Z. Physik B - Condensed Matter 73, 247–255 (1988). https://doi.org/10.1007/BF01305743
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01305743