ExLibris header image
SFX Logo
Title: Epitaxial growth of Si on GaP(100) and Si(111), monitored by soft X-ray reflection
Source:

Surface science letters [0167-2584] Bruijn, M P yr:1985


Collapse list of basic services Basic
Full text
Full text available via Elsevier SD Backfile Physics
GO
Full text available via EZB-NALI5-00465 Elsevier Archive NL
GO
Document delivery
Request document via Library/Bibliothek GO

Expand list of advanced services Advanced
A service provided by the Library of the Wissenschaftspark Albert Einstein, Potsdam, Germany.
© 2005 SFX by Ex Libris Inc.