ExLibris header image
SFX Logo
Title: Evolution from soft to hard breakdown in thin gate oxides: effect of oxide thickness, capacitor area and stress current
Source:

Solid-State Electronics [0038-1101] Cacciato, A yr:2001


Collapse list of basic services Basic
Full text
Full text available via EZB-NALI5-00465 Elsevier Archive NL
GO
Document delivery
Request document via Library/Bibliothek GO

Expand list of advanced services Advanced
A service provided by the Library of the Wissenschaftspark Albert Einstein, Potsdam, Germany.
© 2005 SFX by Ex Libris Inc.