ExLibris header image
SFX Logo
Title: Quantitative measurement of film thickness, density and stoichiometry of multilayer thin films on thick substrates
Source:

Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms [0168-583X] Hichwa, B P yr:1987


Collapse list of basic services Basic
Full text
Full text available via Elsevier SD Backfile High Energy
GO
Full text available via EZB-NALI5-00465 Elsevier Archive NL
GO
Document delivery
Request document via Library/Bibliothek GO

Expand list of advanced services Advanced