ExLibris header image
SFX Logo
Title: The inverse power law model for the lifetime of a mylar-polyurethane laminated dc hv insulating structure
Source:

Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers detectors and Associated Equipment [0168-9002] Kalkanis, G yr:1989


Collapse list of basic services Basic
Full text
Full text available via Elsevier SD Backfile High Energy
GO
Full text available via EZB-NALI5-00465 Elsevier Archive NL
GO
Document delivery
Request document via Library/Bibliothek GO
Users interested in this article also expressed an interest in the following:
1. Johnston, D. "Frequency Acceleration of Voltage Endurance." IEEE Transactions on Electrical Insulation EI-14.3 (1979): 121-126. Link to SFX for this item
2. Meeker, W. "Accelerated degradation tests: modeling and analysis." Technometrics 40.2 (1998): 89-99. Link to SFX for this item
3. SHAO, J. "STATISTICAL-INFERENCE IN STABILITY ANALYSIS." Biometrics 50.3 (1994): 753-763. Link to SFX for this item
4. Prowell, S. "Computing system reliability using Markov chain usage models." The Journal of systems and software 73.2 (2004): 219-225. Link to SFX for this item
5. Porter, A. Accelerated testing and validation. 2004. Link to Full Text for this item Link to SFX for this item
6. Shiau, J. "Analyzing accelerated degradation data by nonparametric regression." IEEE transactions on reliability 48.2 (1999): 149-158. Link to SFX for this item
7. Yang, G. "Accelerated Degradation-Tests With Tightened Critical Values." IEEE transactions on reliability 51.4 (2002): 463-468. Link to SFX for this item
Select All Clear All

Expand list of advanced services Advanced
A service provided by the Library of the Wissenschaftspark Albert Einstein, Potsdam, Germany.
© 2005 SFX by Ex Libris Inc.