Original paper

The crystal structure of sopcheite, Ag4Pd3Te4, from the Lukkulaisvaara intrusion, Karelia, Russia

Laufek, František; Vymazalová, Anna; Grokhovskaya, Tatiana Lvovna; Plášil, Jakub; Dušek, Michal; Orsoev, Dmitryi Anatolevich; Kozlov, Vladimir V

Abstract

The crystal structure of sopcheite, Ag4 Pd3 Te4, has been solved using single-crystal diffraction data for a crystal from the Lukkulaisvaara intrusion, Karelia. The crystal structure is orthorhombic, space group Cmca, a = 12.212(2) A, b = 6.138(2) A, c = 12.234(3) A, V = 917.1(4) A3 and Z = 4. The refinement of the fully anisotropic model led to an R index of 6.47% for 413 unique reflections. Sopcheite crystallizes in a layered structure. The Pd(1) and Pd(2) atoms assume a nearly planar coordination by four Te atoms. Each of the [PdTe4] rectangles shares two opposite Te–Te edges with adjacent rectangles forming six-membered rings with the shape of elongated hexagons. These hexagons are oriented parallel to (100) and form layers of a herringbone pattern. Silver atoms form four-membered rings [Ag4] of almost square shape. The [Ag4] rings are located approximately in the centre of elongated hexagons composed of [PdTe4] rectangles. The crystal structure is stabilised by a number of metal–metal interactions. The crystal structure of the synthetic phase Ag4 Pd3 Te4 was also determined by single-crystal X-ray diffraction (XRD). It corresponds to the structure of sopcheite from the Lukkulaisvaara intrusion. Electron backscatter diffraction data obtained on material from other reported sopcheite occurrences are entirely consistent with this structure model, which is however incompatible with the sole powder XRD pattern reported so far for sopcheite. Combined with the absence of phase transition in Ag4 Pd3 Te4 up to its breakdown temperature, these results imply revision of the previously published crystallographic data of sopcheite.

Keywords

silver palladium telluridesopcheitelukkulaisvaara intrusioncrystal structureplatinum-group mineralag4 pd3 te4x-ray diffraction data