Abstract
- Received 12 October 2016
DOI:https://doi.org/10.1103/PhysRevB.94.139902
©2016 American Physical Society
Physics Subject Headings (PhySH)
Condensed Matter, Materials & Applied Physics
Erratum: Annealing temperature and thickness dependencies of structural and magnetic properties of thin films [Phys. Rev. B 94, 104424 (2016)]
M. Belmeguenai, M. S. Gabor, F. Zighem, Y. Roussigné, D. Faurie, and C. Tiusan
Phys. Rev. B 94, 139902 – Published 31 October 2016
Images
Figure 6
Annealing temperature dependence of (a) the volume and (b) the surface effective perpendicular anisotropy constants in the two regimes below and above the critical thickness. Variation of the different contributions of the (c) magnetocrystalline and the volume magnetoelastic and (d) the Néel-type interface and the surface anisotropy constants for the perpendicular anisotropy. The data in (c) and (d) were obtained from the measurements presented in (a) and (b) using Eqs. (6) and (7). The symbols refer to measurements, and the solid lines are used as guides to the eye. The dashed lines refer to grid lines for zero.
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Annealing temperature dependence of (a) the volume and (b) the surface effective in-plane fourfold anisotropy constants in the two regimes below and above the critical thickness. Variation of the different contributions of the (c) magnetocrystalline and the volume magnetoelastic and (d) the Néel-type interface and the surface anisotropy constants for the in-plane fourfold anisotropy. The data in (c) and (d) were obtained from the measurements presented in (a) and (b) using Eqs. (6) and (7) by replacing the subscript by 4. The symbols refer to measurements, and the solid lines are used as guides to the eye. The dashed lines refer to grid lines for zero.
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